For the Semiconductor / MEMS area

our advanced tools ensure accurate measurements, reliable inspections, and seamless automation, helping you optimize your production processes with ease. Explore our comprehensive offerings and elevate your manufacturing efficiency.

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Metrology

Optical Surface Inspection
Example image for Optical Surface Inspection. Lumina AT1 System
Scanning Electron Microscope
Example image for Scanning Electron Microscope: CUBE 2, Tabletop SEM.
Liquid Flow Measurement & Bubble Detection
Liquid Flow Measurement and Bubble Detection. Ultrasonic Clamp-On Flow Sensor SEMIFLOW co.65 260pi v2.0 from Sonotec
Chemical Concentration Meter
Example image for Chemical Concentration Meter. Rhosonics B30 Series with quaternary.
Wafer Dimensional Metrology
Example image for Wafer Dimensional Metrology. Nanomez WT3500 from Kovis, a hybrid metrology system.

Handling

Wafer Handling
Example image for Wafer Handling. STC Automatic Notch- /Flat-Aligner.
Automation
Example image for Automation. Wafermate300 from Jabil Chat Automation with dual loadport.
Others
Example image for Wafer Handling. STC Automatic Notch- /Flat-Aligner.

new products here:

Chemical Concentration Meter
Chemical Concentration Meter
Chemical Concentration Meter
Lumina AT2 System
Lumina AT2 System
Lumina AT2 System
Lumina AT1 System
Lumina AT1 System
Lumina AT1 System
Automatic Flat/Notch Aligner
Automatic Flat/Notch Aligner
Automatic Flat/Notch Aligner
Wafer Thickness & 3D Optical Profiler RT-3500
Wafer Thickness & 3D Optical Profiler RT-3500
Wafer Thickness & 3D Optical Profiler RT-3500
SONOCHECK® Air Bubble Detector
SONOCHECK® Air Bubble Detector
SONOCHECK® Air Bubble Detector
Ultrasonic Clamp-On Flow Sensor SEMIFLOW®
Ultrasonic Clamp-On Flow Sensor SEMIFLOW®
Ultrasonic Clamp-On Flow Sensor SEMIFLOW®